Skip to content
AI Atlas

Embedding Models Measure in Peculiar Ways

Published 18 Sept 2026arXiv:2609.20821

data quality89

Updated 4 h ago · first seen 18 Sept 2026

paper_01M2SEG35J4T8ENPV89206AFSS

Abstract

Embedding spaces define notions of semantic similarity and distance. We study whether those embeddings reflect physical measurements of mass, distance, time and volume, which admit a unique, objective notion of semantic equivalence and distance. We find that physical measurement is only weakly modeled in the embedding space, and that instead quite peculiar measurement patterns can be observed. Further analysis indicates that embedding representations of physical measurements are strongly influenced by superficial string similarity, and recalibration of similarity does not substantially improve the alignment.

Authors

Authors 2

Andrianos MichailJuri Opitz

Linked names open researcher pages (created from the paper's author list; name-only, no affiliation unless a source states it). Unlinked names have no researcher record yet.

Organizations

Organizations 0

No organization stated. arXiv metadata does not carry affiliations; an organization is linked only when a model card or lab page cites the paper.

Models

Models introduced or described 0

Inbound described_by relations from model cards and documentation.

No model links this paper yet

Model pages link papers through their model cards and documentation; the relation is written only when a source states it.

Datasets

Datasets used 0

No dataset relation recorded.

Benchmarks

Benchmarks used 0

No benchmark relation recorded.

Code

Repositories & frameworks 0

No repository linked.

Timeline

Timeline 2

Full timeline →

Sources

Sources 2

Source documents
SourceDocumentTypeTierLast observedSnapshots
arXiv (Atom API + RSS)rss.arxiv.org/rss/cs.CL feedT1· Official4 h ago7
arXiv (Atom API + RSS)rss.arxiv.org/rss/cs.LG feedT1· Official4 h ago7

Tier 1 = official/primary, 2 = quality secondary, 3 = community, 4 = unverified. Every snapshot is archived; see all sources and the methodology.